NCT04175405

Low-level Laser Therapy With a 635nm Diode Laser on Orthodontic Mini-implants Stability.

Low-level Laser Therapy With a 635nm Diode Laser Affects Orthodontic Mini-implants Stability. A Randomized Clinical Split-Mouth Trial.

• Status: Completed
• Phase: N/A
• Study type: Interventional
• Enrollment: 20 (actual)
• Sponsor: Wroclaw Medical University · Academic / Other
• Sex: All
• Age: —
• Healthy volunteers: Accepted

Summary

The study aimed to clinically estimate an influence of a 635nm diode laser on the primary and secondary stability of orthodontic mini-implants placed in a maxilla, to assess mini-implants failure rate (mini-implant loss) and to evaluate a pain level after the treatment. The randomized clinical split-mouth trial included 15 subjects, 30 implants (Dual Top Anchor System, Seoul, Korea) with a diameter 1.4mm and length of 10mm. Mini-implants were placed in the area of the attached gingiva between the second premolar and first molar teeth 2 mm below the mucogingival junction of both sides of the maxilla in 20 patients (13 women and 7 men; age: 32.5 ± 6.1 years).

Conditions

• Malocclusion, Angle Class II

Interventions

Type	Name	Description
PROCEDURE	Irradiation of implants with 635nm laser	Irradiation of implants with 635nm laser with a dose of 10J

Timeline

• Start date: 2019-03-06
• Primary completion: 2019-06-02
• Completion: 2019-10-24
• First posted: 2019-11-25
• Last updated: 2019-11-25

Locations

1 site across 1 country: Poland